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Volumn 306, Issue 1, 2007, Pages 68-74
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Preparation and characterization of flash evaporated tin selenide thin films
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Author keywords
A1. Characterization; A1. X ray diffraction; A3. Physical vapor deposition processes; A3. Thin film; B3. Optoelectronic devices
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Indexed keywords
POLYCRYSTALLINE FILMS;
SUBSTRATE TEMPERATURES;
TIN SELENIDE THIN FILMS;
OPTOELECTRONIC DEVICES;
PHYSICAL VAPOR DEPOSITION;
POLYCRYSTALLINE MATERIALS;
THERMAL EVAPORATION;
TIN COMPOUNDS;
X RAY DIFFRACTION;
THIN FILMS;
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EID: 34447526304
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jcrysgro.2007.05.004 Document Type: Article |
Times cited : (41)
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References (28)
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