PH sensing reliability of flexible ITO/PET electrodes on EGFETs prepared by a roll-to-roll process

Microelectronics Reliability

Volumn 52, Issue 8, 2012, Pages 1651-1654

  Lue, Cheng En ^a   Wang, I Shun ^a   Huang, Chi Hsien ^a   Shiao, Yu Ting ^a   Wang, Hau Cheng ^a   Yang, Chia Ming ^a   Hsu, Shu Hao ^b   Chang, Ching Yu ^b   Wang, William ^c   Lai, Chao Sung ^a  

^a CHANG GUNG UNIVERSITY   (Taiwan)

^b Win Optical Technology CO LTD   (Taiwan)

^c Crystalvue Medical Corporation   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

AVERAGE SENSITIVITIES; DRY CONDITION; EXTENDED GATE FIELD EFFECT TRANSISTORS; INDIUM TIN OXIDE LAYERS; LIGHT CONDITIONS; PH SENSING; PH SENSITIVITY; RADIO FREQUENCY SPUTTERING; RELIABILITY EVALUATION; ROLL-TO-ROLL PROCESS; STANDARD VARIATION;

ELECTRODES; FIELD EFFECT TRANSISTORS; PH SENSORS; POLYETHYLENE TEREPHTHALATES; SHEET RESISTANCE; TIN; TIN OXIDES;

SENSITIVITY ANALYSIS;

EID: 84863726775     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2011.10.026     Document Type: Article

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