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Volumn 258, Issue 22, 2012, Pages 9054-9057
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Rf Power dependence on the chemical and structural properties of copper oxide thin films obtained at various oxygen fractions
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Author keywords
Copper oxide; rf Magnetron sputtering; X ray induced Auger electron spectroscopy
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Indexed keywords
AUGER ELECTRON SPECTROSCOPY;
AUGERS;
COPPER OXIDES;
MAGNETRON SPUTTERING;
OXIDE FILMS;
OXYGEN;
SCANNING ELECTRON MICROSCOPY;
SURFACE RESISTANCE;
THIN FILMS;
X RAY DIFFRACTION;
COMPOSITIONAL RATIO;
COPPER OXIDE THIN FILMS;
OXYGEN FRACTIONS;
PHYSICAL AND CHEMICAL PROPERTIES;
RF POWER DEPENDENCE;
RF-MAGNETRON SPUTTERING;
SURFACE PROFILERS;
X-RAY INDUCED AUGER ELECTRON SPECTROSCOPIES;
X RAY PHOTOELECTRON SPECTROSCOPY;
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EID: 84863509132
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/j.apsusc.2012.05.159 Document Type: Article |
Times cited : (24)
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References (21)
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