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Volumn 258, Issue 22, 2012, Pages 9054-9057

Rf Power dependence on the chemical and structural properties of copper oxide thin films obtained at various oxygen fractions

Author keywords

Copper oxide; rf Magnetron sputtering; X ray induced Auger electron spectroscopy

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; AUGERS; COPPER OXIDES; MAGNETRON SPUTTERING; OXIDE FILMS; OXYGEN; SCANNING ELECTRON MICROSCOPY; SURFACE RESISTANCE; THIN FILMS; X RAY DIFFRACTION;

EID: 84863509132     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2012.05.159     Document Type: Article
Times cited : (24)

References (21)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.