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Volumn 85, Issue 23, 2012, Pages

Excess noise in STM-style break junctions at room temperature

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EID: 84863322723     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.85.235455     Document Type: Article
Times cited : (35)

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