Proximity effect and multiple Andreev reflections in gold atomic contacts

Physical Review Letters

Volumn 86, Issue 2, 2001, Pages 284-287

  Scheer, E ^a,e   Belzig, W ^b   Naveh, Y ^c,f   Devoret, M H ^d   Esteve, D ^d   Urbina, C ^d  

^a UNIVERSITY OF KARLSRUHE   (Germany)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^c STONY BROOK UNIVERSITY   (United States)

^d CEA SACLAY   (France)

^e UNIVERSITY OF KONSTANZ   (Germany)

^f IBM HAIFA RESEARCH LAB   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRONIC PROPERTIES; FERMI LEVEL; GREEN'S FUNCTION; LOW TEMPERATURE PROPERTIES; QUANTUM THEORY; SCANNING ELECTRON MICROSCOPY; SCANNING TUNNELING MICROSCOPY; STATISTICAL METHODS; SUPERCONDUCTING MATERIALS; SUPERCONDUCTIVITY; TUNNEL JUNCTIONS;

GOLD ATOMIC CONTACTS; MULTIPLE ANDREEV REFLECTIONS; PROXIMITY EFFECT;

ELECTRODES;

EID: 0035128212     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.86.284     Document Type: Article

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