Frequency Dependence of Shot Noise in a Diffusive Mesoscopic Conductor

Physical Review Letters

Volumn 78, Issue 17, 1997, Pages 3370-3373

  Schoelkopf, R J ^a   Burke, P J ^a   Kozhevnikov, A A ^a   Prober, D E ^a   Rooks, M J ^b  

^a YALE UNIVERSITY   (United States)

^b Department of Theoretical and Applied Mechanics and the Cornell Nanofabrication Facility   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS (ELECTRONIC); ELECTRIC CURRENTS; ELECTRON TRANSPORT PROPERTIES; FREQUENCY RESPONSE; HIGH ELECTRON MOBILITY TRANSISTORS; SHOT NOISE; SPECTRUM ANALYSIS; STATISTICAL METHODS; THERMAL EFFECTS; VACUUM; VOLTAGE MEASUREMENT;

COULOMB INTERACTIONS; MESOSCOPIC CONDUCTOR;

SEMICONDUCTOR DEVICES;

EID: 7044232150     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.78.3370     Document Type: Article

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