Synchrotron x-ray nano-tomography characterization of the sintering of multilayered systems

Applied Physics Letters

Volumn 100, Issue 26, 2012, Pages

  Yan, Zilin ^a,b   Guillon, Olivier ^b,c   Wang, Steve ^d   Martin, Christophe L ^a   Lee, Chul Seung ^e   Bouvard, Didier ^a  

^a UNIV GRENOBLE ALPES   (France)

^b DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

^c FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

^d ARGONNE NATIONAL LABORATORY   (United States)

^e Samsung Electro Mechanics   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

3D MICROSTRUCTURES; ANISOTROPIC SHRINKAGE; DIELECTRIC LAYER; INNER-ELECTRODES; MULTI-LAYER CERAMIC CAPACITOR; MULTI-LAYERED SYSTEMS; NICKEL POWDERS; SYNCHROTRON X RAYS;

CERAMIC CAPACITORS; ELECTRODES; TOMOGRAPHY;

SINTERING;

EID: 84863303768     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4730625     Document Type: Article

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