Determination of the atomic weight of 28Si-enriched silicon for a revised estimate of the avogadro constant

Analytical Chemistry

Volumn 84, Issue 5, 2012, Pages 2321-2327

  Yang, Lu ^a   Mester, Zoltán ^a   Sturgeon, Ralph E ^a   Meija, Juris ^a  

^a NATIONAL RESEARCH COUNCIL CANADA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTICAL APPROACH; ATOMIC WEIGHTS; AVOGADRO CONSTANT; FUNDAMENTAL CONSTANTS; INDEPENDENT ASSESSMENT; ISOTOPIC CHARACTERIZATION; LATTICE SPACING; MEASUREMENT RESULTS; MULTI-COLLECTOR INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY; PLANCK CONSTANTS; RYDBERG CONSTANT; SI CRYSTALS;

CHEMICAL ELEMENTS; INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY; METRIC SYSTEM;

SILICON;

EID: 84863231512     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac203006j     Document Type: Article

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