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Volumn 99, Issue 26, 2011, Pages

Distribution of electronic reconstruction at the n-type LaAlO 3/SrTiO 3 interface revealed by hard x-ray photoemission spectroscopy

(12) Chu, Y Y a,b Liao, Y F a Tra, V T c Yang, J C c Liu, W Z b Chu, Y H c Lin, J Y c Huang, J H b Weinen, J d Agrestini, S d Tsuei, K D a Huang, D J a,b

a NATIONAL SYNCHROTRON RADIATION RESEARCH CENTER (Taiwan)

b NATIONAL TSING HUA UNIVERSITY (Taiwan)

c NATIONAL CHIAO TUNG UNIVERSITY (Taiwan)

d MAX PLANCK INSTITUTE FOR CHEMICAL PHYSICS OF SOLIDS (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

GRAZING INCIDENCE; HARD X-RAY PHOTOELECTRON SPECTROSCOPY; HARD X-RAY PHOTOEMISSION SPECTROSCOPY; INCIDENCE ANGLES; SRTIO; UNIT CELLS; X-RAY WAVES;

CHARGE TRANSFER; LANTHANUM ALLOYS; PHOTOELECTRON SPECTROSCOPY; STRONTIUM ALLOYS; STRONTIUM TITANATES;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 84862961755 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3672099 Document Type: Article

Times cited : (10)

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