Photoemission studies of the surface electronic properties of L-CVD SnO 2 ultra thin films

Applied Surface Science

Volumn 258, Issue 21, 2012, Pages 8425-8429

  Kwoka, M ^a   Ottaviano, L ^b   Szuber, J ^a  

^a SILESIAN UNIVERSITY OF TECHNOLOGY   (Poland)

^b UNIVERSITY OF L'AQUILA   (Italy)

Author keywords

Electronic band gap states; Fermi level position; L CVD thin films; Photoemission; Surface electronic properties; Tin dioxide

Indexed keywords

BINDING ENERGY; CARBON FILMS; ELECTRONIC PROPERTIES; ELECTRONIC STATES; ENERGY GAP; FERMI LEVEL; PHOTOEMISSION; SURFACE CHEMISTRY; TIN DIOXIDE; ULTRATHIN FILMS; VALENCE BANDS;

BINDING ENERGY POSITIONS; ELECTRONIC BAND GAPS; PHOTOEMISSION YIELD SPECTROSCOPIES; SNO2 THIN FILMS; SPACE CHARGE LAYERS; SURFACE CARBON; SURFACE ELECTRONIC PROPERTIES; TECHNOLOGICAL TREATMENT;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 84862882476     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2012.03.174     Document Type: Conference Paper

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