A dielectric model of self-assembled monolayer interfaces by capacitive spectroscopy

Langmuir

Volumn 28, Issue 25, 2012, Pages 9689-9699

  Góes, Márcio S ^a   Rahman, Habibur ^b   Ryall, Joshua ^b   Davis, Jason J ^b   Bueno, Paulo R ^a  

^a SÃO PAULO STATE UNIVERSITY UNESP   (Brazil)

^b UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE SPECTROSCOPY; CAPACITOR MODELS; DIELECTRIC MODELS; ELECTRONIC CHARACTERISTICS; HELMHOLTZ; LAYER THICKNESS; LINEAR DEPENDENCE; MOLECULAR FILMS; POLARIZABILITIES; RELAXATION EFFECT;

CAPACITANCE; SELF ASSEMBLED MONOLAYERS;

ORGANIC POLYMERS;

EID: 84862880758     PISSN: 07437463     EISSN: 15205827     Source Type: Journal    
DOI: 10.1021/la301281y     Document Type: Article

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