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Volumn 12, Issue 14, 2012, Pages 2568-2574

A facile route for the fabrication of large-scale gate-all-around nanofluidic field-effect transistors with low leakage current

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; ALUMINUM OXIDE;

EID: 84862874772     PISSN: 14730197     EISSN: 14730189     Source Type: Journal    
DOI: 10.1039/c2lc40112f     Document Type: Article
Times cited : (17)

References (34)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.