Storage life prediction for a high-performance capacitor using multi-phase Wiener degradation model

Communications in Statistics: Simulation and Computation

Volumn 41, Issue 8, 2012, Pages 1317-1335

  Feng, Jing ^a   Sun, Quan ^a   Jin, Tongdan ^b  

^a NATIONAL UNIVERSITY OF DEFENSE TECHNOLOGY   (China)

^b Texas State University   (United States)

Author keywords

High voltage pulse capacitor; Identification of change point; Multi phase wiener process; Performance degradation path model; Storage life prediction

Indexed keywords

BOOTSTRAP METHOD; CHANGE-POINTS; DEGRADATION FAILURE; DEGRADATION MODEL; ELECTRICAL ENERGY; FAILURE THRESHOLDS; IDENTIFICATION PROCEDURE; INTERVAL ESTIMATION; INVERSE GAUSSIAN; MAXIMUM LIKELIHOOD PRINCIPLES; PATH MODELS; PERFORMANCE CHARACTERISTICS; SINGLE-PHASE CONDITIONS; STORAGE LIFE; STORAGE PERFORMANCE; STORAGE TIME; TRANSITION POINT; WIENER PROCESS;

CAPACITANCE; CAPACITORS; MAXIMUM LIKELIHOOD ESTIMATION; POPULATION STATISTICS; TRANSITION FLOW;

DEGRADATION;

EID: 84862859377     PISSN: 03610918     EISSN: 15324141     Source Type: Journal    
DOI: 10.1080/03610918.2011.624241     Document Type: Article

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