|
Volumn 407, Issue 12, 2012, Pages 2258-2261
|
Thickness dependence of piezoelectric property of ultrathin BiFeO 3 films
|
Author keywords
BiFeO 3 film; Piezoelectric property; Thickness
|
Indexed keywords
BFO FILMS;
COVER LAYERS;
EXTERNAL FIELDS;
FERROELECTRIC DOMAINS;
FERROELECTRIC PROPERTY;
LATTICE STRAIN;
MONOTONIC DECREASE;
OUT-OF-PLANE LATTICE PARAMETERS;
PIEZO-RESPONSE FORCE MICROSCOPES;
PIEZOELECTRIC COEFFICIENT;
PIEZOELECTRIC PROPERTY;
PIEZOELECTRIC RESPONSE;
QUANTITATIVE DESCRIPTION;
SRTIO;
SUBSTRATE CLAMPING;
THICKNESS;
THICKNESS DEPENDENCE;
ULTRA-THIN;
FERROELECTRICITY;
FILM GROWTH;
MANGANESE OXIDE;
SUBSTRATES;
ULTRATHIN FILMS;
PIEZOELECTRICITY;
|
EID: 84862808515
PISSN: 09214526
EISSN: None
Source Type: Journal
DOI: 10.1016/j.physb.2012.03.010 Document Type: Article |
Times cited : (26)
|
References (17)
|