Cross-over of the plasticity mechanism in nanocrystalline Cu

Chinese Physics Letters

Volumn 29, Issue 6, 2012, Pages

  Yue, Yong Hai ^a   Wang, Li Hua ^a   Zhang, Ze ^a,b   Han, Xiao Dong ^a  

^a BEIJING UNIVERSITY OF TECHNOLOGY   (China)

^b ZHEJIANG UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

NANOCRYSTALS; TENSILE TESTING;

CRITICAL VALUE; CROSS-OVER; CU THIN FILM; HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPES; NANOCRYSTALLINE CU; PARTIAL DISLOCATIONS; PLASTIC DEFORMATION MECHANISMS; SCHMIDT; TWIN BOUNDARIES; UNIAXIAL TENSILE TEST;

PLASTICITY;

EID: 84862645456     PISSN: 0256307X     EISSN: 17413540     Source Type: Journal    
DOI: 10.1088/0256-307X/29/6/066201     Document Type: Article

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