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Applied Physics Letters

Volumn 98, Issue 5, 2011, Pages

Transmission electron microscopy observations of dislocation annihilation and storage in nanograins

(4) Wang, Lihua a Zhang, Ze a,b Ma, En c Han, X D a

a BEIJING UNIVERSITY OF TECHNOLOGY (China)

b ZHEJIANG UNIVERSITY (China)

c Johns Hopkins University (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC SCALE; DISLOCATION ANNIHILATION; DISLOCATION DENSITIES; DISLOCATION DIPOLE; HIGH DENSITY; IN-SITU; IN-SITU TRANSMISSION; NANO GRAINS; NANOGRAINED MATERIALS; TIME-RESOLVED; TRANSMISSION ELECTRON MICROSCOPY OBSERVATION;

GRAIN BOUNDARIES; IN SITU PROCESSING;

TRANSMISSION ELECTRON MICROSCOPY;

EID: 79951475343 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3549866 Document Type: Article

Times cited : (57)

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