In Situ observation of dislocation behavior in nanometer grains

Physical Review Letters

Volumn 105, Issue 13, 2010, Pages

  Wang, Lihua ^a   Han, Xiaodong ^a   Liu, Pan ^a   Yue, Yonghai ^a   Zhang, Ze ^a,b   Ma, En ^c  

^a BEIJING UNIVERSITY OF TECHNOLOGY   (China)

^b ZHEJIANG UNIVERSITY   (China)

^c Johns Hopkins University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC SCALE; DISLOCATION DYNAMICS; IN-SITU; IN-SITU OBSERVATIONS; NANO-SCALE DEFORMATION; NANOMETER GRAINS; PARTIAL DISLOCATIONS; TIME-RESOLVED; TRANSMISSION ELECTRON MICROSCOPE;

DEFORMATION; PLATINUM; TRANSMISSION ELECTRON MICROSCOPY; ULTRATHIN FILMS;

STACKING FAULTS;

EID: 77957133739     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.105.135501     Document Type: Article

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