The influence of the surface morphologies of Langmuir Blodgett (LB) thin films of porphyrins on their gas sensing properties

Sensors and Actuators, B: Chemical

Volumn 158, Issue 1, 2011, Pages 62-68

  Ayci, D ^a   Stanciu, S G ^b   Capan I ^a   Erdoan, M ^a   Guner B ^a   Hristu, R ^b   Stanciu, G A ^b  

^a BALIKESIR UNIVERSITY   (Turkey)

^b UNIVERSITY POLITEHNICA OF BUCHAREST   (Romania)

Author keywords

Atomic Force Microscopy (AFM); Gas sensing mechanism; Langmuir Blodgett (LB) thin films; Porphyrins; Quartz Crystal Microbalance (QCM)

Indexed keywords

BENZENE AND TOLUENE; DEPOSITION PARAMETERS; FREE BASE; GAS SENSING; GAS SENSING APPLICATIONS; GAS SENSING MECHANISM; GAS SENSING PROPERTIES; IRON CHLORIDES; LANGMUIR-BLODGETT; OPTIMUM CONDITIONS; PORPHINE; QUARTZ CRYSTAL MICROBALANCE (QCM); RESONANCE FREQUENCIES; SURFACE AREA; THIN-FILM DEPOSITIONS;

ATOMIC FORCE MICROSCOPY; BENZENE; CHEMICAL DETECTION; CHLORINE COMPOUNDS; COBALT; DEPOSITION; GAS DETECTORS; GASES; IRON COMPOUNDS; MAGNESIUM; PIEZOELECTRIC DEVICES; PORPHYRINS; QUARTZ; QUARTZ CRYSTAL MICROBALANCES; RESONANCE; SURFACE PROPERTIES; THIN FILM TRANSISTORS; THIN FILMS; TOLUENE; VAPOR DEPOSITION; VOLATILE ORGANIC COMPOUNDS;

LANGMUIR BLODGETT FILMS;

EID: 79960473817     PISSN: 09254005     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.snb.2011.05.033     Document Type: Article

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