Effect of roughness as determined by atomic force microscopy on the wetting properties of PTFE thin films

Polymer Engineering and Science

Volumn 36, Issue 14, 1996, Pages 1849-1855

  Miller, J D ^a   Veeramasuneni, S ^a   Drelich, J ^a   Yalamanchili, M R ^a   Yamauchi, G ^b  

^a UNIVERSITY OF UTAH   (United States)

^b NTT CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; BINDERS; CONTACT ANGLE; FRACTALS; GONIOMETERS; POLYTETRAFLUOROETHYLENES; SURFACE ROUGHNESS; THIN FILMS; VACUUM DEPOSITED COATINGS; WETTING;

CONTACT ANGLE GONIOMETRY; FRACTAL DIMENSIONS; HYDROPHOBIC COATINGS;

PLASTIC FILMS;

EID: 0030196661     PISSN: 00323888     EISSN: None     Source Type: Journal    
DOI: 10.1002/pen.10580     Document Type: Article

References (24)

1. R. N. Wenzel, Ind. Eng. Chem., 28, 988 (1936).
2. F. E. Bartell and J. W. Shephard, J. Phys. Chem., 57, 211 (1953).
3. A. B. D. Cassie and S. Baxter, Trans. Farad. Soc., 40, 546 (1944).
4. R. H. Dettre and R. E. Johnson, Adv. Chem. Ser. No., 43, 136 (1963).
5. Y. Tamal and K. Aratani, J. Phys. Chem., 76, 3267 (1972).
6. J. F. Oliver, C. Huh, and S. G. Mason, J. Adhesion, 8, 223 (1977).
7. J. F. Oliver, C. Huh, and S. G. Mason, Colloids and Surfaces, 1, 79 (1980).
8. J. F. Oliver and S. G. Mason, J. Mater. Sci., 15, 431 (1980).
9. R. Shuttleworth and G. L. J. Bailey, Disc. Farad. Soc., 3, 16 (1948).
10. R. H. Dettre and R. E. Johnson, Adv. Chem. Ser. No., 43, 112 (1963).
11. C. Huh and S. G. Mason, J. Colloid Interface Sci., 60, 11 (1977).
12. J. D. Eick and R. J. Good, J. Colloid Interface Sci., 53, 235 (1975).
13. J. Drelich and J. D. Miller, Part. Sci. Tech., 10, 1 (1992).
14. J. Drelich and J. D. Miller, Preprints, Society for Mining and Metallurgy, and Exploration Inc., Preprint No. 95-11, Annual Meeting, Denver, (1995).
15. G. Yamauchi, Telecom Forum No., 10, 18 (1994).
16. G. Binning, C. F. Quate, and Ch. Gerber, Phys. Rev. Lett., 56, 930 (1986).
17. H. K. Wickramasinghe, Sci. Am. 260., 10, 98 (1989).
18. R. J. Good, J. Am. Chem. Soc., 74, 5041 (1952).
19. B. Drake, C. B. Prater, A. L. Weisenhorn, S. A. C. Gould, T. R. Albrecht, C. F. Quate, D. S. Cannell, H. G. Hansma, and P. K. Hansma, Science., 243, 1586 (1989).
20. Command Reference Manual, Version 3.0, Digital Instruments, Inc., Santa Barbara, Calif. (1993).
21. D. Saupe, in The Science of Fractal Images, H. O. Peitgen and D. Saupe, eds., Springer-Verlag, New York (1988).
22. R. D. Hazlett, J. Colloid Interface Sci., 137, 527 (1990).
23. H. J. Busscher, A. W. J. Vanpelt, P. De Boer, H. P. De Jong, and J. Arends, Colloids Surfaces, 9, 319 (1984).
24. S. J. Hitchcock, N. T. Carroll, and M. G. Nicholas, J. Mater. Sci., 16, 714 (1981).