Studying polymer/fullerene intermixing and miscibility in laterally patterned films with X-ray spectromicroscopy

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Volumn 8, Issue 12, 2012, Pages 1920-1927

  He, Xiaoxi ^a   Collins, Brian A ^b   Watts, Benjamin ^c   Ade, Harald ^b   McNeill, Christopher R ^d  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b NORTH CAROLINA STATE UNIVERSITY   (United States)

^c PAUL SCHERRER INSTITUTE   (Switzerland)

^d MONASH UNIVERSITY   (Australia)

Author keywords

fullerenes; miscibility; polymers; thin films; X ray spectromicroscopy

Indexed keywords

FULLERENE DERIVATIVE; FULLERENE FILMS; LATERAL DIFFUSION; METHYL ESTERS; PATTERNED FILMS; POLY(3-HEXYLTHIOPHENE); REGIO-REGULAR; REGIORANDOM; RR-P3HT; SILICON NITRIDE MEMBRANE; SOLID-STATE DIFFUSION; X-RAY SPECTROMICROSCOPY;

BUTYRIC ACID; CARRIER MOBILITY; ESTERIFICATION; ESTERS; FULLERENES; MIXING; PHOTOLITHOGRAPHY; POLYMERS; SILICON NITRIDE; SOLUBILITY; THIN FILMS; THIOPHENE; X RAYS;

POLYMER FILMS;

FULLERENE DERIVATIVE; POLY(2,7 (BENZO(2,1 B 3,4 B')DITHIOPHENE) ALT 2,2' (3,3' DIDODECYL 5,5' BITHIOPHENYL)); POLY(2,7-(BENZO(2,1-B-3,4-B')DITHIOPHENE)-ALT-2,2'-(3,3'-DIDODECYL-5,5'-BITHIOPHENYL)); POLY(3 HEXYLTHIOPHENE); POLY(3-HEXYLTHIOPHENE); POLYMER; THIOPHENE DERIVATIVE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL MODEL; CHEMISTRY; METHODOLOGY; MICROSCOPY; SOLAR ENERGY; SPECTROPHOTOMETRY; SURFACE PROPERTY; X RAY;

FULLERENES; MICROSCOPY; MICROSCOPY, ATOMIC FORCE; MODELS, CHEMICAL; POLYMERS; SOLAR ENERGY; SPECTROPHOTOMETRY; SURFACE PROPERTIES; THIOPHENES; X-RAYS;

EID: 84862511723     PISSN: 16136810     EISSN: 16136829     Source Type: Journal    
DOI: 10.1002/smll.201102382     Document Type: Article

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