Improving the reliability of the background extrapolation in transmission electron microscopy elemental maps by using three pre-edge windows

Ultramicroscopy

Volumn 118, Issue , 2012, Pages 11-16

  Heil, Tobias ^a   Gralla, Benedikt ^a   Epping, Michael ^a   Kohl, Helmut ^a  

^a UNIVERSITY OF MÜNSTER   (Germany)

Author keywords

Chi squared test; EFTEM; Elemental mapping; Four window method; Signal to noise ratio

Indexed keywords

ACQUISITION PARAMETERS; BACKGROUND MODEL; CHI-SQUARED TEST; DATA POINTS; EFTEM; ELEMENTAL MAPPING; ELEMENTAL MAPS; ENERGY FILTERED TRANSMISSION ELECTRON MICROSCOPY; ENERGY WINDOWS; EXPERIMENTAL DATA; FIT PARAMETERS; FOUR-WINDOW METHOD; SIGNALTONOISE RATIO (SNR);

MODELS; SIGNAL TO NOISE RATIO; TRANSMISSION ELECTRON MICROSCOPY;

EXTRAPOLATION;

ACCURACY; ARTICLE; ENERGY FILTERED TRANSMISSION ELECTRON MICROSCOPY; IMAGE QUALITY; RELIABILITY; SIGNAL NOISE RATIO;

MICROSCOPY, ELECTRON, TRANSMISSION; MICROSCOPY, ENERGY-FILTERING TRANSMISSION ELECTRON; MODELS, THEORETICAL; REPRODUCIBILITY OF RESULTS; SIGNAL-TO-NOISE RATIO;

EID: 84862312901     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2012.04.009     Document Type: Article

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