SCOPUS 정보 검색 플랫폼

Journal of Applied Physics

Volumn 111, Issue 10, 2012, Pages

Coexistence of unipolar and bipolar resistive switching in BiFeO 3 and Bi 0.8Ca 0.2FeO 3 films

(7) Liu, Lu a Zhang, Shantao b Luo, Ying a Yuan, Guoliang a Liu, Junming b Yin, Jiang b Liu, Zhiguo b

a NANJING UNIVERSITY OF SCIENCE AND TECHNOLOGY (China)

b NANJING UNIVERSITY (China)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGED DEFECTS; CURRENT VOLTAGE; HIGH RESISTANCE; LOW VOLTAGE REGION; MEMORY EFFECTS; PARAELECTRICS; POLYCRYSTALLINE FILM; RESISTIVE SWITCHING; SWITCH-ON;

DEFECT DENSITY; ELECTROFORMING; FERROELECTRIC FILMS; IRON OXIDES;

SWITCHING SYSTEMS;

EID: 84862133475 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.4716867 Document Type: Conference Paper

Times cited : (45)

References (17)

1
- 0037436499
- 10.1126/science.1080615
- J. Wang, J. B. Neaton, H. Zheng, V. Nagarajan, S. B. Ogale, B. Liu, D. Viehland, V. Vaithyanathan, D. G. Schlom, U. V. Waghmare, N. A. Spaldin, K. M. Rabe, M. Wuttig, and R. Ramesh, Science 299, 1719 (2003). 10.1126/science. 1080615
- (2003) Science , vol.299 , pp. 1719
- Wang, J.¹ Neaton, J.B.² Zheng, H.³ Nagarajan, V.⁴ Ogale, S.B.⁵ Liu, B.⁶ Viehland, D.⁷ Vaithyanathan, V.⁸ Schlom, D.G.⁹ Waghmare, U.V.¹⁰ Spaldin, N.A.¹¹ Rabe, K.M.¹² Wuttig, M.¹³ Ramesh, R.¹⁴

2
- 64249168806
- 10.1126/science.1168636
- T. Choi, S. Lee, Y. J. Choi, V. Kiryukhin, and S. W. Cheong, Science 63, 324 (2009). 10.1126/science.1168636
- (2009) Science , vol.63 , pp. 324
- Choi, T.¹ Lee, S.² Choi, Y.J.³ Kiryukhin, V.⁴ Cheong, S.W.⁵

3
- 79952403920
- 10.1002/adma.201004317
- A. Q. Jiang, C. Wang, K. J. Jin, X. B. Liu, J. F. Scott, C. S. Hwang, T. A. Tang, H. B. Lu, and G. Z. Yang, Adv. Mater. 23, 1277 (2011). 10.1002/adma.201004317
- (2011) Adv. Mater. , vol.23 , pp. 1277
- Jiang, A.Q.¹ Wang, C.² Jin, K.J.³ Liu, X.B.⁴ Scott, J.F.⁵ Hwang, C.S.⁶ Tang, T.A.⁷ Lu, H.B.⁸ Yang, G.Z.⁹

4
- 79960185107
- 10.1063/1.3601113
- Y. Shuai, S. Q. Zhou, D. Burger, M. Helm, and H. Schmidt, J. Appl. Phys. 109, 124117 (2011). 10.1063/1.3601113
- (2011) J. Appl. Phys. , vol.109 , pp. 124117
- Shuai, Y.¹ Zhou, S.Q.² Burger, D.³ Helm, M.⁴ Schmidt, H.⁵

5
- 77958581512
- 10.1088/0957-4484/21/42/425202
- M. Li, Z. G. Fei, X. J. Zhu, K. Yin, J. Wang, Y. W. Liu, C. He, B. Chen, and R. W. Li, Nanotechnology 21, 425202 (2010). 10.1088/0957-4484/21/42/425202
- (2010) Nanotechnology , vol.21 , pp. 425202
- Li, M.¹ Fei, Z.G.² Zhu, X.J.³ Yin, K.⁴ Wang, J.⁵ Liu, Y.W.⁶ He, C.⁷ Chen, B.⁸ Li, R.W.⁹

6
- 67650102619
- 10.1002/adma.200900375
- R. Waser, R. Dittmann, G. Staikov, and K. Szot, Adv. Mater. 21, 2632 (2009). 10.1002/adma.200900375
- (2009) Adv. Mater. , vol.21 , pp. 2632
- Waser, R.¹ Dittmann, R.² Staikov, G.³ Szot, K.⁴

7
- 80053375590
- 10.1088/0022-3727/44/41/415104
- X. J. Zhu, Z. G. Fei, M. Li, K. B. Yin, Y. W. Liu, Z. H. Zuo, B. Chen, and R. W. Li, J. Phys. D: Appl. Phys. 44, 415104 (2011). 10.1088/0022-3727/44/ 41/415104
- (2011) J. Phys. D: Appl. Phys. , vol.44 , pp. 415104
- Zhu, X.J.¹ Fei, Z.G.² Li, M.³ Yin, K.B.⁴ Liu, Y.W.⁵ Zuo, Z.H.⁶ Chen, B.⁷ Li, R.W.⁸

8
- 76649119087
- 10.1038/nnano.2009.451
- S. Y. Yang, J. Seidel, S. J. Byrnes, P. Shafer, C.-H. Yang, M. D. Rossell, P. Yu, Y.-H. Chu, J. F. Scott, J. W. Ager III, L. W. Martin, and R. Ramesh, Nat. Nanotechnol. 5, 143 (2010). 10.1038/nnano.2009.451
- (2010) Nat. Nanotechnol. , vol.5 , pp. 143
- Yang, S.Y.¹ Seidel, J.² Byrnes, S.J.³ Shafer, P.⁴ Yang, C.-H.⁵ Rossell, M.D.⁶ Yu, P.⁷ Chu, Y.-H.⁸ Scott, J.F.⁹ Ager Iii, J.W.¹⁰ Martin, L.W.¹¹ Ramesh, R.¹²

9
- 77957563001
- 10.1103/PhysRevB.82.085319
- L. Pintilie, V. Stancu, L. Trupina, and I. Pintilie, Phys. Rev. B 82, 085319 (2010). 10.1103/PhysRevB.82.085319
- (2010) Phys. Rev. B , vol.82 , pp. 085319
- Pintilie, L.¹ Stancu, V.² Trupina, L.³ Pintilie, I.⁴

10
- 79955694483
- 10.1063/1.3584031
- T. L. Qu, Y. G. Zhao, D. Xie, J. P. Shi, Q. P. Chen, and T. L. Ren, Appl. Phys. Lett. 98, 173507 (2011). 10.1063/1.3584031
- (2011) Appl. Phys. Lett. , vol.98 , pp. 173507
- Qu, T.L.¹ Zhao, Y.G.² Xie, D.³ Shi, J.P.⁴ Chen, Q.P.⁵ Ren, T.L.⁶

11
- 67349117817
- 10.1038/nmat2432
- C.-H. Yang, J. Seidel, S. Y. Kim, P. B. Rossen, P. Yu, M. Gajek, Y. H. Chu, L. W. Martin, M. B. Holcomb, Q. He, P. Maksymovych, N. Balke, S. V. Kalinin, A. P. Baddorf, S. R. Basu, M. L. Scullin, and R. Ramesh, Nature Mater. 8, 485 (2009). 10.1038/nmat2432
- (2009) Nature Mater. , vol.8 , pp. 485
- Yang, C.-H.¹ Seidel, J.² Kim, S.Y.³ Rossen, P.B.⁴ Yu, P.⁵ Gajek, M.⁶ Chu, Y.H.⁷ Martin, L.W.⁸ Holcomb, M.B.⁹ He, Q.¹⁰ Maksymovych, P.¹¹ Balke, N.¹² Kalinin, S.V.¹³ Baddorf, A.P.¹⁴ Basu, S.R.¹⁵ Scullin, M.L.¹⁶ Ramesh, R.¹⁷

12
- 77952386757
- 10.1039/b927508h
- A. Stroppa and S. Picozzi, Phys. Chem. Chem. Phys. 12, 5405 (2010). 10.1039/b927508h
- (2010) Phys. Chem. Chem. Phys. , vol.12 , pp. 5405
- Stroppa, A.¹ Picozzi, S.²

13
- 67149123647
- 10.1126/science.1171200
- P. Maksymovych, S. Jesse, P. Yu, R. Ramesh, A. P. Baddorf, and S. V. Kalinin, Science 324, 1421 (2009). 10.1126/science.1171200
- (2009) Science , vol.324 , pp. 1421
- Maksymovych, P.¹ Jesse, S.² Yu, P.³ Ramesh, R.⁴ Baddorf, A.P.⁵ Kalinin, S.V.⁶

14
- 79952910061
- 10.1088/0022-3727/44/12/125404
- X. W. Sun, G. Q. Li, X. A. Zhang, L. H. Ding, and W. F. Zhang, J. Phys. D: Appl. Phys. 44, 125404 (2011). 10.1088/0022-3727/44/12/125404
- (2011) J. Phys. D: Appl. Phys. , vol.44 , pp. 125404
- Sun, X.W.¹ Li, G.Q.² Zhang, X.A.³ Ding, L.H.⁴ Zhang, W.F.⁵

15
- 43549126477
- 10.1016/S1369-7021(08)70119-6
- A. Sawa, Mater. Today 11, 28 (2008). 10.1016/S1369-7021(08)70119-6
- (2008) Mater. Today , vol.11 , pp. 28
- Sawa, A.¹

16
- 77955725082
- 10.1063/1.3467838
- K. B. Yin, M. Li, Y. W. Liu, C. L. He, F. Zhuge, B. Chen, W. Lu, X. Q. Pan, and R. W. Li, Appl. Phys. Lett. 97, 042101 (2010). 10.1063/1.3467838
- (2010) Appl. Phys. Lett. , vol.97 , pp. 042101
- Yin, K.B.¹ Li, M.² Liu, Y.W.³ He, C.L.⁴ Zhuge, F.⁵ Chen, B.⁶ Lu, W.⁷ Pan, X.Q.⁸ Li, R.W.⁹

17
- 78449303523
- 10.1002/adma.201001872
- R. Muenstermann, T. Menke, R. Dittmann, and R. Waser, Adv. Mater. 22, 4819 (2010). 10.1002/adma.201001872
- (2010) Adv. Mater. , vol.22 , pp. 4819
- Muenstermann, R.¹ Menke, T.² Dittmann, R.³ Waser, R.⁴

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