Effect of rapid thermal annealing on properties of thermally evaporated nanostructured CdTe thin film treated with CdCl 2

Materials Science in Semiconductor Processing

Volumn 15, Issue 2, 2012, Pages 159-164

  Ismail, Raid A ^a  

^a UNIVERSITY OF TECHNOLOGY   (Iraq)

Author keywords

AFM; Cadmium telluride; Evaporation; Optical properties; Rapid thermal annealing

Indexed keywords

AFM; ANNEALED FILMS; ANNEALING TIME; AS-GROWN; CDTE; CRYSTALLINE NATURE; CUBIC PHASE; ELECTRICAL MEASUREMENT; FILM RESISTIVITY; GRAIN SIZE; NANO-STRUCTURED; P-TYPE; PREFERENTIAL ORIENTATION; ROOT MEAN SQUARE ROUGHNESS;

ATOMIC FORCE MICROSCOPY; CADMIUM CHLORIDE; CADMIUM TELLURIDE; CRYSTALLINE MATERIALS; EVAPORATION; OPTICAL PROPERTIES; VACUUM EVAPORATION; X RAY DIFFRACTION;

RAPID THERMAL ANNEALING;

EID: 84862130616     PISSN: 13698001     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mssp.2011.10.005     Document Type: Article

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