Correlation of stability to varied CdCl2 treatment and related defects in CdS/CdTe PV devices as measured by thermal admittance spectroscopy

Journal of Physics and Chemistry of Solids

Volumn 66, Issue 11, 2005, Pages 1883-1886

  Enzenroth, R Albert ^a   Barth, K L ^a   Sampath, W S ^a  

^a Department of Environmental and Radiological Health Sciences   (United States)

Author keywords

A. Semiconductors; A. Thin films; D. Electrical properties

Indexed keywords

SEMICONDUCTOR MATERIALS; SPECTROSCOPIC ANALYSIS; STRESS ANALYSIS; THIN FILMS;

A. SEMICONDUCTORS; A. THIN FILMS; D. ELECTRICAL PROPERTIES;

CADMIUM COMPOUNDS;

EID: 29144534137     PISSN: 00223697     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpcs.2005.09.022     Document Type: Conference Paper

References (15)

1. K.L. Barth, R.A. Enzenroth, and W.S. Sampath Advances in continuous, in-line processing of stable CdS/CdTe devices Twenty ninth IEEE PVSC 2002
2. K.D. Dobson, I. Visoly-Fisher, G. Hodes, and D. Cahen Stability of CdTe/CdS thin-film solar cells Solar Energy Mater. Solar Cells 62 2000 295 325
3. T.K. Borg, Commercial production of thin-film CdTe photovoltaic modules, Report to NREL, NREL/SR-520-23733, 1997.
4. T.X. Zhou, N. Reiter, R.C. Powell, R. Sasala, and P.V. Meyers Vapor chloride treatment of polycrystalline CdTe/CdS films IEEE PVSC conference 1994 pp. 103-106
5. W.S. Sampath, K.L. Barth, and R.A. Enzenroth Continuous, in-line processing of stable CdS/CdTe devices NCPV Program Review Meeting Prodeedings 2001
6. W.S. Sampath, K.L. Barth, R.A. Enzenroth, Stability, Yield and Efficiency of CdS/CdTe Devices, NREL Annual Report, Subcontract ADJ-1-30630-07, available at www.engr.colostate.edu/me/facil/mel/
7. R.A. Enzenroth, K.L. Barth, and W.S. Sampath Continuous, in-line processing of CdS/CdTe devices: progress towards consistent stability Proceedings of the 19th European Photovoltaic Solar Energy Conference 2004 pp. 1980-1983
8. A.S. Gilmore, V. Kaydanov, T.R. Ohno, D. Rose, S.D. Feldman, and P. Erslev Treatment effects on deep levels in CdTe based solar cells IEEE PVSC proceedings 2002 pp. 604-607
9. P. Blood, and J.W. Orton (Chapter 9) The Electrical Characterization of Semiconductors: Majority Carriers and Electron States 1992 Academic Press New York 0-12-528627-9
10. J. Kneisel, J. Kneisel, Kai Siemer, Ilka Luck, and Dieter Braunig Admittance spectroscopy of efficient CuInS2 thin film solar cells J. Appl. Phys. 88 9 2000 5474 5481
11. 2 treatment of thin film CdTe solar cells studied with temperature dependent admittance spectroscopy Proceedings of the IEEE PVSV conference 2002 pp. 704-707
12. A.S. Gilmore, V. Kaydanov, T.R. Ohno, and D. Rose Admittance spectroscopy of deep levels in CdTe solar cells NCPV Rev. 2001 187
13. T. Walter, R. Herberholz, C. Muller, and H.W. Schock Determination of defect distributions from admittance measurements and application to Cu(In,Ga)Se2 based heterojunctions J. Appl. Phys. 80 8 1996 4411 4420
14. Personal communication with Seymour F., CSM, 2004.
15. S.M. So, W. Hwang, P.V. Meyers, and C.H. Liu Defect levels in electroposited n-type CdTe thin films J. Appl. Phys. 61 6 1987 2234 2243