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Volumn 100, Issue 20, 2012, Pages

Complementary resistive switching in tantalum oxide-based resistive memory devices

Author keywords

[No Author keywords available]

Indexed keywords

MEMORY CELL; PATH PROBLEMS; POLARITY REVERSAL; POTENTIAL SOLUTIONS; RESISTIVE MEMORIES; RESISTIVE SWITCHING; SWITCHING EFFECT; SYMMETRY-BREAKING; VOLTAGE BIAS;

EID: 84861822371     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4719198     Document Type: Article
Times cited : (205)

References (15)
  • 1
  • 15
    • 84861825450 scopus 로고    scopus 로고
    • See supplementary material at E-APPLAB-100-080221 for pulse programming and readout of a CRS cell and endurance measurement results.
    • See supplementary material at http://dx.doi.org/10.1063/1.4719198 E-APPLAB-100-080221 for pulse programming and readout of a CRS cell and endurance measurement results.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.