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Volumn 100, Issue 21, 2012, Pages

Acceptor-like deep level defects in ion-implanted ZnO

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE VOLTAGE; DEEP LEVEL; DEEP-LEVEL DEFECTS; DEFECT EVOLUTION; DOSE-DEPENDENT; ENERGY POSITION; IMPLANTATION DEPTH; INTRINSIC DEFECTS; ION DOSE; RE-DISTRIBUTION; ROOM TEMPERATURE; TRANSIENT SPECTROSCOPY; ZNO;

EID: 84861807037     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4720514     Document Type: Article
Times cited : (17)

References (24)
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    • 10.1063/1.1663500
    • L. C. Kimerling, J. Appl. Phys. 45, 1839 (1974). 10.1063/1.1663500
    • (1974) J. Appl. Phys. , vol.45 , pp. 1839
    • Kimerling, L.C.1
  • 11
    • 0001450206 scopus 로고
    • 10.1007/BF01340694
    • E. Mollwo, Z. Phys. 138, 478 (1954). 10.1007/BF01340694
    • (1954) Z. Phys. , vol.138 , pp. 478
    • Mollwo, E.1
  • 14
    • 0345772325 scopus 로고    scopus 로고
    • 10.1103/PhysRevB.68.193303
    • N. H. Nickel and K. Brendel, Phys. Rev. B 68, 193303 (2003). 10.1103/PhysRevB.68.193303
    • (2003) Phys. Rev. B , vol.68 , pp. 193303
    • Nickel, N.H.1    Brendel, K.2
  • 22
    • 85013840926 scopus 로고    scopus 로고
    • edited by C. Jagadish and S. J. Pearton (Elsevier, Oxford)
    • Zinc Oxide Bulk, Thin films and Nanostructures, edited by, C. Jagadish, and, S. J. Pearton, (Elsevier, Oxford, 2006).
    • (2006) Zinc Oxide Bulk, Thin Films and Nanostructures


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.