A derivative-based fast autofocus method in electron microscopy

Journal of Mathematical Imaging and Vision

Volumn 44, Issue 1, 2012, Pages 38-51

  Rudnaya, M E ^a   Ter Morsche, H G ^a   Maubach, J M L ^a   Mattheij, R M M ^a  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Autofocus focusing; Scanning transmission electron microscopy; Sharpness function

Indexed keywords

ANALYTICAL PROPERTIES; AUTO-FOCUS; AUTOMATIC FOCUSING; CONTROL VARIABLE; DEFOCUS; MATHEMATICAL FOUNDATIONS; PARTICLE ANALYSIS; QUADRATIC POLYNOMIAL; SCANNING TRANSMISSION ELECTRON MICROSCOPES; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SHARPNESS FUNCTION; SPEED IMPROVEMENT;

IMAGE QUALITY; TRANSMISSION ELECTRON MICROSCOPY;

FUNCTIONS;

EID: 84861739599     PISSN: 09249907     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10851-011-0309-8     Document Type: Article

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