Application of Laser-Backscattering Instruments for In Situ Monitoring of Crystallization Processes - A Review

Chemical Engineering and Technology

Volumn 35, Issue 6, 2012, Pages 967-979

  Heinrich, Jörg ^a   Ulrich, Joachim ^a  

^a MARTIN LUTHER UNIVERSITY HALLE WITTENBERG   (Germany)

Author keywords

Chord length distribution; Crystallization; Focused beam reflectance measurement; Particle size analysis; Threefold dynamical optical reflectance measurement

Indexed keywords

CHORD LENGTH DISTRIBUTION; CRYSTALLIZATION PROCESS; CRYSTALLIZATION PROCESS DEVELOPMENT; FOCUSED BEAM REFLECTANCE MEASUREMENT; IN-SITU; IN-SITU MONITORING; KINETIC CONSTANT; NON-DESTRUCTIVE MEASUREMENT; OPTICAL MODELS; SUSPENSION DENSITIES;

CRYSTALLIZATION; PARTICLE SIZE ANALYSIS; REFLECTOMETERS;

BACKSCATTERING;

EID: 84861706592     PISSN: 09307516     EISSN: 15214125     Source Type: Journal    
DOI: 10.1002/ceat.201100344     Document Type: Review

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