Applicability of the laser backscattering instruments FBRM and 3D ORM SMF in batch crystallizations;Anwendbarkeit der Lasermessverfahren FBRM und 3D ORM SMF in Batch-Kristallisationen

Chemie-Ingenieur-Technik

Volumn 83, Issue 4, 2011, Pages 558-562

  Peda, Stefan ^a   Bröckel, Ulrich ^b   Ay, Peter ^c   Stollberg, Christian ^a  

^a Hochschule Wismar   (Germany)

^b TRIER UNIVERSITY OF APPLIED SCIENCES   (Germany)

^c BRANDENBURG UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

3D ORM SMF; Crystallization; FBRM; In situ monitoring; Particle measuring technique

Indexed keywords

3D ORM SMF; BASIC IDEA; BATCH CRYSTALLIZATION; BATCH CRYSTALLIZATION PROCESS; CRYSTAL SIZE; FBRM; FOCUSED BEAM REFLECTANCE MEASUREMENT; IN-SITU; IN-SITU-MONITORING; LASER BACKSCATTERING; MODEL MATERIAL SYSTEMS; PARTICLE MEASURING TECHNIQUE; REAL TIME ANALYSIS; REFLECTANCE MEASUREMENTS; TIME-DEPENDENT;

BACKSCATTERING; CRYSTALLIZATION KINETICS; MATERIALS SCIENCE; MONITORING; REFLECTION; REFLECTOMETERS; THREE DIMENSIONAL COMPUTER GRAPHICS;

THREE DIMENSIONAL;

EID: 79953239236     PISSN: 0009286X     EISSN: 15222640     Source Type: Journal    
DOI: 10.1002/cite.201000127     Document Type: Article

References (20)

1. Z. Q. Yu, P. S. Chow, R. B. H. Tan, Org. Process Res. Dev. 2008, 12 (4), 646. DOI: 10.1021/op800063n
2. A. R. Heath, P. D. Fawell, P. A. Bahri, J. D. Swift, Part. Part. Syst. Charact. 2002, 19 (2), 84. DOI: 10.1002/1521-4117(200205)19:2<84::AID- PPSC84>3.0.CO;2-1 (Pubitemid 34638801)
3. L. Ehrl, M. Soos, M. Morbidelli, Part. Part. Syst. Charact. 2002, 23 (6), 438. DOI: 10.1002/ppsc.200601081
4. F. Schwartz, Produktunterlagen Live Particle Sizer, S&E GmbH, Düsseldorf 2009.
5. E. F. Hobbel, et al., Part. Part. Syst. Charact. 1991, 8 (1-4), 29. DOI: 10.1002/ppsc.19910080107
6. N. Kail, H. Briesen, W. Marquardt, Part. Part. Syst. Charact. 2007, 24 (3), 184. DOI: 10.1002/ppsc.200601036 (Pubitemid 47561070)
7. F. K. Preikschat, E. Preikschat, US Patent 4 871 251, 1989.
8. M. Lenzing, WO 2006/131181 A2, 2006.
9. R. G. Sparks, C. L. Dobbs, Part. Part. Syst. Charact. 1993, 10 (5), 279. DOI: 10.1002/ppsc.19930100512
10. F. H. Schwartz, M. Braun, US Patent 5 900 933, 1999.
11. J. D'Ans, E. Lax, Taschenbuch für Chemiker und Physiker, Vol. 3, 4th ed., Springer Verlag, Berlin 1998.
12. W. Yu, K. Erickson, Powder Technol. 2008, 185 (1), 24. DOI: 10.1016/j.powtec.2007.09.011 (Pubitemid 351671810)
13. J. E. Mark. Polymer Data Handbook, 1st ed., Oxford University Press, Oxford 1998.
14. Malvern Instruments, Sample Dispersion & Refractive Index Guide, Malvern Instruments Ltd., Worcestershire (UK) 1997.
15. Verein Deutscher Ingenieure, VDI Wärmeatlas, 10th ed., Springer Verlag, Berlin 2006.
16. D. O'Grady, 2006 CVG Conference, Toronto, October 2006.
17. Deutsches Institut für Normung, DIN ISO 9276-1, Beuth Verlag, Berlin 2004.
18. M. Stiess, Mechanische Verfahrenstechnik-Partikeltechnologie 1, 3rd ed., Springer Verlag, Berlin 2009.
19. E. J. W. Wynn, Powder Technol. 2003, 133 (1-3), 125. DOI: 10.1016/S0032-5910(03)00084-6 (Pubitemid 36952166)
20. M. Kempkes, J. Eggers, M. Mazzotti, Chem. Eng. Sci. 2008, 63 (19), 4656. DOI: 10.1016/j.ces.2007.10.030