Process analysis by means of focused beam reflectance measurements

Industrial and Engineering Chemistry Research

Volumn 48, Issue 6, 2009, Pages 2936-2946

  Kail, Norbert ^a   Marquardt, Wolfgang ^a   Briesen, Heiko ^a,b  

^a RWTH AACHEN UNIVERSITY   (Germany)

^b TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE PHARMACEUTICAL INGREDIENTS; BATCH CRYSTALLIZATIONS; CHORD LENGTHS; CLASS BOUNDARIES; DYNAMIC PROCESS; FOCUSED BEAM REFLECTANCE MEASUREMENTS; FOOD AND DRUG ADMINISTRATIONS; IN-SITU; LENGTH DISTRIBUTIONS; MATHEMATICAL METHODS; MEASUREMENT ARTIFACTS; PARTICLE CHARACTERIZATIONS; PARTICLE GROWTHS; PARTICLE-SIZE DISTRIBUTIONS; PROCESS ANALYSIS; PROCESS ANALYTICAL TECHNOLOGIES; SECONDARY NUCLEATIONS; TIME EVOLUTIONS;

CRYSTALLIZATION; FAULT DETECTION; POWER SPECTRAL DENSITY; PROCESS MONITORING; PULSE SHAPING CIRCUITS; QUALITY ASSURANCE; QUALITY FUNCTION DEPLOYMENT; REFLECTION; REFLECTOMETERS; RESTORATION; SUGARS; TOTAL QUALITY MANAGEMENT;

QUALITY CONTROL;

EID: 65349192839     PISSN: 08885885     EISSN: None     Source Type: Journal    
DOI: 10.1021/ie800839s     Document Type: Article

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