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Volumn 85, Issue 20, 2012, Pages

Formation, migration, and clustering of delocalized vacancies and interstitials at a solid-state semicoherent interface

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EID: 84861569874     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.85.205416     Document Type: Article
Times cited : (36)

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