Micro- and nano-scale electrical characterization of epitaxial graphene on off-axis 4H-SiC (0001)

Materials Science Forum

Volumn 717-720, Issue , 2012, Pages 637-640

  Giannazzo, F ^a   Bongiorno, C ^a   Di Franco, S ^a   Rimini, E ^a   Raineri, V ^a  

^a CNR IMM   (Italy)

Author keywords

Electron mean free path; Epitaxial graphene; Mobility; Specific contact resistance

Indexed keywords

CARRIER MOBILITY; CONTACT RESISTANCE; FIELD EFFECT TRANSISTORS; GATE DIELECTRICS; INERT GASES; NANOTECHNOLOGY; SCANNING PROBE MICROSCOPY; SILICON CARBIDE;

ELECTRICAL CHARACTERIZATION; ELECTRON MEAN FREE PATH; EPITAXIAL GRAPHENE; FIELD EFFECT TRANSISTOR (FETS); FIELD-EFFECT MOBILITIES; SPECIFIC CONTACT RESISTANCES; SUBMICROMETER SCALE; TRANSMISSION LINE MODELING;

GRAPHENE;

EID: 84861416618     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/MSF.717-720.637     Document Type: Conference Paper

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