Chain-length-identification strategy in zinc polyphosphate glasses by means of XPS and ToF-SIMS

Analytical and Bioanalytical Chemistry

Volumn 403, Issue 5, 2012, Pages 1415-1432

  Crobu, Maura ^a   Rossi, Antonella ^a,b   Mangolini, Filippo ^a   Spencer, Nicholas D ^a  

^a ETH ZURICH   (Switzerland)

^b UNIVERSITY OF CAGLIARI   (Italy)

Author keywords

Fourier transform IR spectroscopy; Polyphosphate glasses; Time of flight secondary ion mass spectroscopy; X ray photoelectron spectroscopy

Indexed keywords

AUGER PARAMETERS; BULK COMPOUNDS; FOURIER TRANSFORM IR SPECTROSCOPY; FT-IR STUDY; INTEGRATED INTENSITIES; OUTERMOST MONOLAYERS; POLYPHOSPHATES; SECONDARY-ION MASS SPECTROSCOPY; TOF SIMS; ZINC CONTENT;

BINDING ENERGY; CHAIN LENGTH; FOURIER TRANSFORM INFRARED SPECTROSCOPY; GLASS; MASS SPECTROMETERS; MONOLAYERS; OXYGEN; PHOSPHATES; PHOTOELECTRONS; SECONDARY ION MASS SPECTROMETRY; SURFACE CHEMISTRY; X RAY PHOTOELECTRON SPECTROSCOPY;

ZINC;

EID: 84861227917     PISSN: 16182642     EISSN: 16182650     Source Type: Journal    
DOI: 10.1007/s00216-012-5836-7     Document Type: Article

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