A multi-technique approach of tribofilm characterisation

Thin Solid Films

Volumn 447-448, Issue , 2004, Pages 272-277

  Minfray, C ^a   Martin, J M ^a   Esnouf, C ^b   Le Mogne, T ^a   Kersting, R ^c   Hagenhoff, B ^c  

^a LABORATOIRE DE TRIBOLOGIE ET DYNAMIQUE DES SYSTÈMES   (France)

^b UNIVERSITÉ DE LYON   (France)

^c TASCON GMBH   (Germany)

Author keywords

Transmission electron microscopy; Tribofilm; X Ray photoelectron spectroscopy

Indexed keywords

ABSORPTION SPECTROSCOPY; AUGER ELECTRON SPECTROSCOPY; ION BEAMS; PRECIPITATION (CHEMICAL); SECONDARY ION MASS SPECTROMETRY; SURFACE CHEMISTRY; TRANSMISSION ELECTRON MICROSCOPY; TRIBOLOGY; X RAY PHOTOELECTRON SPECTROSCOPY; ZINC COMPOUNDS;

SURFACE ANALYSIS TOOLS; TRIBOFILMS;

THIN FILMS;

EID: 1342323681     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(03)01064-2     Document Type: Conference Paper

References (10)

1. Fuller M.L.S., Kasrai M., Bancroft G.M., Fyfe K., Tan K.H. Tribol. Int. 31:(10):1998;627-644.
2. Willermet P.A., Dailey D.P., Carter R.O., Schmitz P.J., Zhu W. Tribol. Int. 28:1995;177-187.
3. Martin J.M. Tribol. Lett. 6:1999;1-8.
4. Martin J.M., Grossiord C., Le Mogne T., Bec S., Tonck A. Tribol. Int. 34:2001;523-530.
5. J. Bell, K.M. Delargy, Proceedings of the 6th International Congres on Tribology 'Eurotrib 93', Vol. 2, M. Kozma, Budapest, 1993, p. 328.
6. J.C. Bell, K.M. Delargy, A. Seeney, Proceedings of the 18th Leeds-Lyon Symposium on Tribology, Dowson et al., Elsevier, Amsterdam, 1992, p. 387.
7. Vickerman J.C., Briggs D.A. TOF-SIMS: Surface Analysis by Mass Spectrometry. 2001;Chichester, IM Publications.
8. Yin Z., Kasrai M., Fuller M., Bancroft G.M., Fyfe K., Tan K.H. Wear. 202:1997;172-191.
9. Grossiord C., Martin J.M., Le Mogne T., Palermo T. Tribol. Lett. 6:1999;171-179.
10. Onyiriuka E.C. J. Non-Cryst. Solids. 163:1993;268-273.