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Volumn 51, Issue 6, 2012, Pages 860-867
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Microstructural evolution and dielectric properties of 1D AlN powders synthesized by microwave technique
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Author keywords
Aluminum nitride; Dielectric properties; Microwave technique; SEM; Synthesis
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Indexed keywords
ALN;
ALN POWDER;
ELECTRONIC DEVICE;
ENERGY DISPERSIVE X RAY ANALYZER;
FOURIER TRANSFORM INFRARED SPECTROMETER;
FT-IR SPECTRUM;
GRANULAR MORPHOLOGY;
HIGH DIELECTRIC CONSTANTS;
IMPEDANCE ANALYZER;
LOW TEMPERATURE SYNTHESIS;
MICROWAVE TECHNIQUE;
OPTIMUM PROCESSING;
PROCESSING TIME;
SEM MICROGRAPHS;
WURTZITE PHASE;
WURTZITES;
X-RAY DIFFRACTION METHOD;
XRD;
ALUMINUM NITRIDE;
FOURIER TRANSFORM INFRARED SPECTROSCOPY;
LOW TEMPERATURE EFFECTS;
NANORODS;
POWDERS;
SCANNING ELECTRON MICROSCOPY;
SYNTHESIS (CHEMICAL);
X RAY DIFFRACTION;
ZINC SULFIDE;
DIELECTRIC PROPERTIES;
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EID: 84861095002
PISSN: 07496036
EISSN: 10963677
Source Type: Journal
DOI: 10.1016/j.spmi.2012.02.011 Document Type: Article |
Times cited : (3)
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References (21)
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