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Physical Review Letters

Volumn 108, Issue 19, 2012, Pages

Tailoring of keV-ion beams by image charge when transmitting through rhombic and rectangular shaped nanocapillaries

(6) Zhang, H Q a,c Akram, N a Skog, P a Soroka, I L a,d Trautmann, C b Schuch, R a

a STOCKHOLM UNIVERSITY (Sweden)

b GSI HELMHOLTZZENTRUM FÜR SCHWERIONENFORSCHUNG GMBH (Germany)

c LANZHOU UNIVERSITY (China)

d ROYAL INSTITUTE OF TECHNOLOGY (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

CAPILLARITY; ION BEAMS; MICA; SILICATE MINERALS;

BEAM-SHAPING; IMAGE CHARGES; ION TRANSMISSION; NANOCAPILLARIES; RECTANGULAR CROSS-SECTIONS; RECTANGULAR GEOMETRY; RECTANGULAR-SHAPED; TRANSMISSION PROFILES;

IONS;

EID: 84860738678 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.108.193202 Document Type: Article

Times cited : (36)

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