Multiply-charged ion nanobeams

International Journal of Nanotechnology

Volumn 5, Issue 6-8, 2008, Pages 809-817

  Cassimi, A ^a,e   Muranaka, T ^a,f   Maunoury, L ^a,e   Lebius, H ^a,e   Manil, B ^a,e,f   Huber, B A ^a,g,h   Ikeda, T ^b,i   Kanai, Y ^b,i   Kojima, T M ^b   Iwai, Y ^b   Kambara, T ^b,j   Yamazaki, Y ^b,c   Nebiki, T ^d   Narusawa, T ^d  

^a DIF   (France)

^b RIKEN   (Japan)

^c UNIVERSITY OF TOKYO   (Japan)

^d KOCHI UNIVERSITY OF TECHNOLOGY   (Japan)

^e Centre Interdisciplinaire de Recherche Ions Lasers   (France)

^f UNIVERSITÉ DE CAEN   (France)

^g RUHR UNIVERSITY BOCHUM   (Germany)

^h CEA GRENOBLE   (France)

ⁱ Grenoble ^*

^j RIKEN Nishina Center for Accelerated Based Science   (Japan)

more..

Author keywords

Charge exchange; Multiply charged ions; Nanobeams; Patterning; Surface analysis; Tapered glass tubes

Indexed keywords

CHARGE TRANSFER; GLASS; LUNAR SURFACE ANALYSIS; NANOWIRES; SURFACE ANALYSIS;

CHARGE EXCHANGES; GLASS TUBES; MULTIPLY CHARGED IONS; NANOBEAMS; PATTERNING;

IONS;

EID: 45849129850     PISSN: 14757435     EISSN: None     Source Type: Journal    
DOI: 10.1504/IJNT.2008.018699     Document Type: Article

References (9)

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