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Volumn 107, Issue 1-4, 1996, Pages 181-184

Ion track diameters in mica studied with scanning force microscopy

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001553236     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-583X(95)01037-8     Document Type: Article
Times cited : (56)

References (20)
  • 16
    • 0040537284 scopus 로고    scopus 로고
    • private communication
    • S. Bouffard, private communication.
    • Bouffard, S.1
  • 19
    • 0005241430 scopus 로고    scopus 로고
    • Proceedings (3rd Conf. on Swift Heavy Ions in Matter, Caen, France, 1995)
    • V. Chailley, E. Dooryhée and M. Levalois, these Proceedings (3rd Conf. on Swift Heavy Ions in Matter, Caen, France, 1995) Nucl. Instr. and Meth. B 107 (1996) 199.
    • (1996) Nucl. Instr. and Meth. B , vol.107 , pp. 199
    • Chailley, V.1    Dooryhée, E.2    Levalois, M.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.