Guiding of highly charged ions by highly ordered SiO2 nanocapillaries

Physical Review A - Atomic, Molecular, and Optical Physics

Volumn 73, Issue 4, 2006, Pages

  Sahana, M B ^a,b   Skog, P ^a   Vikor, Gy ^a   Kumar, R T Rajendra ^a   Schuch, R ^a  

^a Atomic Physics   (Sweden)

^b WAYNE STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPILLARITY; ELECTRIC CHARGE; ELECTROCHEMISTRY; ETCHING; NANOSTRUCTURED MATERIALS; PHOTOCHEMICAL REACTIONS; SILICA;

ANGULAR DISTRIBUTION; CHARGE PATCHES; ELECTROCHEMICAL ETCHING; NANOCAPILLARIES;

IONS;

EID: 33646370243     PISSN: 10502947     EISSN: 10941622     Source Type: Journal    
DOI: 10.1103/PhysRevA.73.040901     Document Type: Article

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