In-situ observation of recovery and grain growth in high purity aluminum

Materials Science Forum

Volumn 715-716, Issue , 2012, Pages 447-454

  Hefferan, C M ^a   Li, S F ^a   Lind, J ^a   Lienert, U ^b   Rollett, A D ^a,c   Suter, R M ^a,c  

^a CARNEGIE MELLON UNIVERSITY   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

^c CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

Grain growth; Microstructure; Orientation imaging; Synchrotron radiation; X ray diffraction

Indexed keywords

ALUMINUM; ANNEALING; GRAIN BOUNDARIES; MICROSTRUCTURE; RECRYSTALLIZATION (METALLURGY); SINGLE CRYSTALS; SYNCHROTRON RADIATION; X RAY DIFFRACTION;

ADVANCED PHOTON SOURCE; HIGH ENERGY X-RAY DIFFRACTION; HIGH PURITY ALUMINUM; IN-SITU MEASUREMENT; IN-SITU OBSERVATIONS; ORIENTATION DISTRIBUTIONS; ORIENTATION IMAGING; THREE-DIMENSIONAL GRAIN STRUCTURES;

GRAIN GROWTH;

EID: 84860720017     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/MSF.715-716.447     Document Type: Conference Paper

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