Characterization of different shaped nanocrystallites using X-ray diffraction line profiles

Particle and Particle Systems Characterization

Volumn 28, Issue 1-2, 2011, Pages 19-24

  Li, Zongquan ^a  

^a ZHEJIANG UNIVERSITY   (China)

Author keywords

Computer simulation; Line profile; Nanocrystallite; X ray diffraction

Indexed keywords

COMPUTER SIMULATION; NANOCRYSTALLITES; X RAY DIFFRACTION;

BRAGG'S LAW; DEBYE SCATTERING EQUATION; LINE POSITIONS; LINE PROFILES; MILLER INDICES; NANOCRYSTALLINE CU; QUANTITATIVE INFORMATION;

NANOCRYSTALS;

EID: 84860684254     PISSN: 09340866     EISSN: 15214117     Source Type: Journal    
DOI: 10.1002/ppsc.200900062     Document Type: Article

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