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Volumn 443-444, Issue , 2004, Pages 107-110

Approximate Estimation of Contributions to Pure X-Ray Diffraction Line Profiles from Crystallite Shapes, Sizes and Strains by Analysing Peak Widths

(1) Kojdecki, Marek Andrzej a

a MILITARY UNIVERSITY OF TECHNOLOGY (Poland)

Author keywords

Crystalline Microstructure Determination; Polycrystal Modelling; X Ray Diffraction Line Profile Analysis; X Ray Powder Diffractometry

Indexed keywords

COMPUTER SIMULATION; CRYSTAL LATTICES; DISLOCATIONS (CRYSTALS); GRAIN BOUNDARIES; INTEGRATION; MICROSTRUCTURE; POWDERS; PROBABILITY; STRAIN; X RAY POWDER DIFFRACTION;

CRYSTALLINE MICROSTRUCTURE DETERMINATION; POLYCRYSTAL MODELING; X-RAY DIFFRACTION LINE PROFILE ANALYSIS; X-RAY POWDER DIFFRACTOMETRY;

POLYCRYSTALLINE MATERIALS;

EID: 0842305037 PISSN: 02555476 EISSN: 16629752 Source Type: Book Series
DOI: 10.4028/www.scientific.net/msf.443-444.107 Document Type: Conference Paper

Times cited : (12)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.