Accuracy improvements in microwave transistor noise parameters extraction

Proceedings of the International Semiconductor Conference, CAS

Volumn 2, Issue , 1997, Pages 361-364

  Vasilescu, G ^a   Alquie, G ^a  

^a SORBONNE UNIVERSITÉ   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC IMPEDANCE; MICROWAVE DEVICES; SIGNAL NOISE MEASUREMENT; SPURIOUS SIGNAL NOISE;

MICROWAVE TRANSISTORS; NOISE PARAMETER EXTRACTION METHOD;

TRANSISTORS;

EID: 0030638115     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)