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Volumn 58, Issue 4, 2009, Pages 1072-1077

Variable termination unit for noise-parameter measurement

Author keywords

Amplifier noise parameters; Noise measurement; Source pull technique; Uncertainty analysis

Indexed keywords

ACOUSTIC NOISE MEASUREMENT; AUDIO FREQUENCY AMPLIFIERS; TEMPERATURE MEASUREMENT;

EID: 63449116381     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2008.2007055     Document Type: Conference Paper
Times cited : (6)

References (10)
  • 1
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    • Precision measurement method for cryogenic amplifier noise temperatures below 5 K
    • Mar
    • J. Randa, E. Gerecht, D. Gu, and R. L. Billinger, "Precision measurement method for cryogenic amplifier noise temperatures below 5 K," IEEE Trans. Microw. Theory Tech., vol. 54, no. 5, pp. 1180-1189, Mar. 2006.
    • (2006) IEEE Trans. Microw. Theory Tech , vol.54 , Issue.5 , pp. 1180-1189
    • Randa, J.1    Gerecht, E.2    Gu, D.3    Billinger, R.L.4
  • 2
    • 0242551685 scopus 로고    scopus 로고
    • On-wafer noise characterization of low-noise amplifiers in the Ka-band
    • Oct
    • S. Long, L. Escotte, J. Graffeuil, F. Brasseau, and J. Louis, "On-wafer noise characterization of low-noise amplifiers in the Ka-band," IEEE Trans. Instrum. Meas., vol. 52, no. 5, pp. 1606-1610, Oct. 2003.
    • (2003) IEEE Trans. Instrum. Meas , vol.52 , Issue.5 , pp. 1606-1610
    • Long, S.1    Escotte, L.2    Graffeuil, J.3    Brasseau, F.4    Louis, J.5
  • 3
    • 34547432721 scopus 로고    scopus 로고
    • Measurement of a 270 GHz low noise amplifier with 7.5 dB noise figure
    • Jul
    • T. Gaier et al., "Measurement of a 270 GHz low noise amplifier with 7.5 dB noise figure," IEEE Microw. Wireless Compon. Lett., vol. 17, no. 7, pp. 546-548, Jul. 2007.
    • (2007) IEEE Microw. Wireless Compon. Lett , vol.17 , Issue.7 , pp. 546-548
    • Gaier, T.1
  • 4
    • 34047239829 scopus 로고    scopus 로고
    • On-wafer measurement of transistor noise parameters at NIST
    • Apr
    • J. Randa and D. K. Walker, "On-wafer measurement of transistor noise parameters at NIST," IEEE Trans. Instrum. Meas., vol. 56, no. 2, pp. 551-554, Apr. 2007.
    • (2007) IEEE Trans. Instrum. Meas , vol.56 , Issue.2 , pp. 551-554
    • Randa, J.1    Walker, D.K.2
  • 5
    • 0031119360 scopus 로고    scopus 로고
    • Amplifier noise measurement at NIST
    • Apr
    • D. Wait and J. Randa, "Amplifier noise measurement at NIST," IEEE Trans. Instrum. Meas., vol. 46, no. 2, pp. 482-485, Apr. 1997.
    • (1997) IEEE Trans. Instrum. Meas , vol.46 , Issue.2 , pp. 482-485
    • Wait, D.1    Randa, J.2
  • 6
    • 51949094153 scopus 로고    scopus 로고
    • Noise-parameter measurement with automated variable terminations
    • D. Gu, D. K. Walker, and J. Randa, "Noise-parameter measurement with automated variable terminations," in CPEM Conf. Dig., 2008, pp. 706-707.
    • (2008) CPEM Conf. Dig , pp. 706-707
    • Gu, D.1    Walker, D.K.2    Randa, J.3
  • 7
    • 0018720739 scopus 로고
    • Thru-reflect-line: An improved technique for calibrating the dual six-port automatic network analyzer
    • Dec
    • G. F. Engen and C. A. Hoer, "Thru-reflect-line: An improved technique for calibrating the dual six-port automatic network analyzer," IEEE Trans. Microw. Theory Tech., vol. MTT-27, no. 12, pp. 987-993, Dec. 1979.
    • (1979) IEEE Trans. Microw. Theory Tech , vol.MTT-27 , Issue.12 , pp. 987-993
    • Engen, G.F.1    Hoer, C.A.2
  • 8
    • 17444367437 scopus 로고    scopus 로고
    • Design and testing of NFRad - A new noise measurement system
    • Boulder, CO, NIST Tech. Note 1518, Mar
    • C. A. Grosvenor, J. Randa, and R. L. Billinger, "Design and testing of NFRad - A new noise measurement system," Nat. Inst. Stand. Technol. Boulder, CO, NIST Tech. Note 1518, Mar. 2000.
    • (2000) Nat. Inst. Stand. Technol
    • Grosvenor, C.A.1    Randa, J.2    Billinger, R.L.3
  • 9
    • 0026943152 scopus 로고
    • Wave techniques for noise modeling and measurement
    • Nov
    • S. Wedge and D. Rutledge, "Wave techniques for noise modeling and measurement," IEEE Trans. Microw. Theory Tech., vol. 40, no. 11, pp. 2004-2012, Nov. 1992.
    • (1992) IEEE Trans. Microw. Theory Tech , vol.40 , Issue.11 , pp. 2004-2012
    • Wedge, S.1    Rutledge, D.2
  • 10
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    • Uncertainty analysis for NIST noise-parameter measurements
    • to be published
    • J. Randa, "Uncertainty analysis for NIST noise-parameter measurements," IEEE Trans. Instrum. Meas., to be published.
    • IEEE Trans. Instrum. Meas
    • Randa, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.