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1
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33644987563
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Precision measurement method for cryogenic amplifier noise temperatures below 5 K
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Mar
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J. Randa, E. Gerecht, D. Gu, and R. L. Billinger, "Precision measurement method for cryogenic amplifier noise temperatures below 5 K," IEEE Trans. Microw. Theory Tech., vol. 54, no. 5, pp. 1180-1189, Mar. 2006.
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(2006)
IEEE Trans. Microw. Theory Tech
, vol.54
, Issue.5
, pp. 1180-1189
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Randa, J.1
Gerecht, E.2
Gu, D.3
Billinger, R.L.4
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2
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0242551685
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On-wafer noise characterization of low-noise amplifiers in the Ka-band
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Oct
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S. Long, L. Escotte, J. Graffeuil, F. Brasseau, and J. Louis, "On-wafer noise characterization of low-noise amplifiers in the Ka-band," IEEE Trans. Instrum. Meas., vol. 52, no. 5, pp. 1606-1610, Oct. 2003.
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(2003)
IEEE Trans. Instrum. Meas
, vol.52
, Issue.5
, pp. 1606-1610
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Long, S.1
Escotte, L.2
Graffeuil, J.3
Brasseau, F.4
Louis, J.5
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3
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34547432721
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Measurement of a 270 GHz low noise amplifier with 7.5 dB noise figure
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Jul
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T. Gaier et al., "Measurement of a 270 GHz low noise amplifier with 7.5 dB noise figure," IEEE Microw. Wireless Compon. Lett., vol. 17, no. 7, pp. 546-548, Jul. 2007.
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(2007)
IEEE Microw. Wireless Compon. Lett
, vol.17
, Issue.7
, pp. 546-548
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Gaier, T.1
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4
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34047239829
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On-wafer measurement of transistor noise parameters at NIST
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Apr
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J. Randa and D. K. Walker, "On-wafer measurement of transistor noise parameters at NIST," IEEE Trans. Instrum. Meas., vol. 56, no. 2, pp. 551-554, Apr. 2007.
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(2007)
IEEE Trans. Instrum. Meas
, vol.56
, Issue.2
, pp. 551-554
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Randa, J.1
Walker, D.K.2
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5
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0031119360
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Amplifier noise measurement at NIST
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Apr
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D. Wait and J. Randa, "Amplifier noise measurement at NIST," IEEE Trans. Instrum. Meas., vol. 46, no. 2, pp. 482-485, Apr. 1997.
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(1997)
IEEE Trans. Instrum. Meas
, vol.46
, Issue.2
, pp. 482-485
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Wait, D.1
Randa, J.2
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6
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51949094153
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Noise-parameter measurement with automated variable terminations
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D. Gu, D. K. Walker, and J. Randa, "Noise-parameter measurement with automated variable terminations," in CPEM Conf. Dig., 2008, pp. 706-707.
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(2008)
CPEM Conf. Dig
, pp. 706-707
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Gu, D.1
Walker, D.K.2
Randa, J.3
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7
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0018720739
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Thru-reflect-line: An improved technique for calibrating the dual six-port automatic network analyzer
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Dec
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G. F. Engen and C. A. Hoer, "Thru-reflect-line: An improved technique for calibrating the dual six-port automatic network analyzer," IEEE Trans. Microw. Theory Tech., vol. MTT-27, no. 12, pp. 987-993, Dec. 1979.
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(1979)
IEEE Trans. Microw. Theory Tech
, vol.MTT-27
, Issue.12
, pp. 987-993
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Engen, G.F.1
Hoer, C.A.2
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8
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17444367437
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Design and testing of NFRad - A new noise measurement system
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Boulder, CO, NIST Tech. Note 1518, Mar
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C. A. Grosvenor, J. Randa, and R. L. Billinger, "Design and testing of NFRad - A new noise measurement system," Nat. Inst. Stand. Technol. Boulder, CO, NIST Tech. Note 1518, Mar. 2000.
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(2000)
Nat. Inst. Stand. Technol
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Grosvenor, C.A.1
Randa, J.2
Billinger, R.L.3
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9
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0026943152
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Wave techniques for noise modeling and measurement
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Nov
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S. Wedge and D. Rutledge, "Wave techniques for noise modeling and measurement," IEEE Trans. Microw. Theory Tech., vol. 40, no. 11, pp. 2004-2012, Nov. 1992.
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(1992)
IEEE Trans. Microw. Theory Tech
, vol.40
, Issue.11
, pp. 2004-2012
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Wedge, S.1
Rutledge, D.2
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10
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63449124600
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Uncertainty analysis for NIST noise-parameter measurements
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to be published
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J. Randa, "Uncertainty analysis for NIST noise-parameter measurements," IEEE Trans. Instrum. Meas., to be published.
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IEEE Trans. Instrum. Meas
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Randa, J.1
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