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Volumn 111, Issue 8, 2012, Pages

Real-space microscopic electrical imaging of n +-p junction beneath front-side Ag contact of multicrystalline Si solar cells

Author keywords

[No Author keywords available]

Indexed keywords

AG CONTACTS; ATOMIC FORCE; BROKEN DOWN; CRYSTALLOGRAPHIC DEFECTS; DOPING CONCENTRATION; ELECTRICAL IMAGING; ELECTROSTATIC POTENTIALS; EUTECTIC POINTS; JUNCTION DEPTH; MULTICRYSTALLINE SI; RE CRYSTALLIZATIONS; REAL-SPACE; SCANNING CAPACITANCE MICROSCOPY; SCANNING KELVIN PROBE FORCE MICROSCOPY; SOLAR CELL PERFORMANCE;

EID: 84860503118     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4703923     Document Type: Article
Times cited : (14)

References (25)
  • 14
    • 0033297834 scopus 로고    scopus 로고
    • For a review, see,. 10.1146/annurev.matsci.29.1.471
    • For a review, see C. C. Williams, Annu. Rev. Mater. Sci. 29, 471 (1999). 10.1146/annurev.matsci.29.1.471
    • (1999) Annu. Rev. Mater. Sci. , vol.29 , pp. 471
    • Williams, C.C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.