Light degradation test and design of thermal performance for high-power light-emitting diodes

Microelectronics Reliability

Volumn 52, Issue 5, 2012, Pages 794-803

  Su, Yen Fu ^a   Yang, Shin Yueh ^a   Hung, Tuan Yu ^a   Lee, Chang Chun ^b   Chiang, Kuo Ning ^a,c  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^b CHUNG YUAN CHRISTIAN UNIVERSITY   (Taiwan)

^c NATIONAL CENTER FOR HIGH PERFORMANCE COMPUTING   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

DESIGN CONCEPT; ELECTRO-OPTICAL; FINITE ELEMENT MODELS; FORWARD VOLTAGE; HIGH POWER LED; HIGH POWER LIGHT EMITTING DIODES; INPUT POWER; JUNCTION TEMPERATURES; LED PACKAGING; LIGHT DEGRADATION; POLLUTION REDUCTION; THERMAL PERFORMANCE;

CONVERSION EFFICIENCY; DEGRADATION; DESIGN; FLUORESCENT LAMPS; LIGHT EMISSION;

LIGHT EMITTING DIODES;

EID: 84860363676     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2011.07.059     Document Type: Article

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