Complete characterization of thermoelectric materials by a combined van der Pauw approach and the effect of radiation losses

Materials Research Society Symposium Proceedings

Volumn 1314, Issue , 2011, Pages 45-50

  De Boor, Johannes ^a   Schmidt, Volker ^a  

^a MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

RADIATION LOSS; RADIATIVE HEAT LOSS; RELATIVE ERRORS; THERMAL CONDUCTIVITY MEASUREMENTS; THERMOELECTRIC CHARACTERIZATION; THERMOELECTRIC FIGURE OF MERIT; THERMOELECTRIC MATERIAL; VAN DER PAUW; VAN DER PAUW METHOD;

THERMAL CONDUCTIVITY; THERMOELECTRICITY;

THERMOELECTRIC EQUIPMENT;

EID: 84860195236     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/opl.2011.514     Document Type: Conference Paper

References (9)

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