A derivation of the van der Pauw formula from electrostatics

Solid-State Electronics

Volumn 52, Issue 1, 2008, Pages 91-98

  Weiss, Jonathan D ^a   Kaplar, Robert J ^a   Kambour, Kenneth E ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

Electrostatics boundary value problem; Resistivity measurement; van der Pauw technique

Indexed keywords

CONFORMAL MAPPING; ELECTRIC POTENTIAL; ELECTROSTATICS; SEMICONDUCTOR DEVICES; VAN DER WAALS FORCES;

ELECTROSTATICS BOUNDARY-VALUE PROBLEM; INFINITESIMAL THICKNESS; RESISTIVITY MEASUREMENT; VAN DER PAUW TECHNIQUE;

ELECTRIC CONDUCTIVITY;

EID: 36248953764     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sse.2007.07.029     Document Type: Article

References (12)

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