Role of in-plane polarizability of the tip in scattering near-field microscopy of a plasmonic nanoparticle

Optics Express

Volumn 20, Issue 8, 2012, Pages 8689-8699

  Kim, Deok Soo ^a   Kim, Zee Hwan ^a  

^a Korea University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

NANOPARTICLES; PLASMONS; SCANNING PROBE MICROSCOPY; SCATTERING; SILICON;

CROSS-POLARIZED; FIELD COMPONENTS; IN-PLANE DIRECTION; IN-PLANE FIELDS; METAL-COATED; NEAR FIELD MICROSCOPY; OUT-OF-PLANE; PLASMON MODES; PLASMONIC NANOPARTICLE; POLARIZABILITIES; POLARIZATION ANISOTROPY; SCATTERING MODEL; SCATTERING-TYPE SCANNING NEAR-FIELD OPTICAL MICROSCOPY (S-SNOM); VISIBLE FREQUENCIES;

POLARIZATION;

EID: 84860113076     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.20.008689     Document Type: Article

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