Runtime leakage minimization through probability-aware dual-Vt or dual-Tox assignment

Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC

Volumn 1, Issue , 2005, Pages 399-404

  Lee, Dongwoo ^a   Blaauw, David ^a   Sylvester, Dennis ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED DESIGN; ECONOMIC AND SOCIAL EFFECTS;

LEAKAGE REDUCTION; OPTIMIZATION ALGORITHMS; PROCESS SCALING; RUNTIME LEAKAGE; STANDBY MODE; STATE PROBABILITY; THICK OXIDES; TRADE OFF;

PROBABILITY;

EID: 84860029267     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1120725.1120884     Document Type: Conference Paper

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